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   journal of intelligent manufacturing   
سال:2016 - دوره:27 - شماره:3


  tick  A multi-stage control chart pattern recognition scheme based on independent component analysis and support vector machine - صفحه:653-664

  tick  A quantitative estimation technique for welding quality using local mean decomposition and support vector machine - صفحه:525-533

  tick  A weighted-coupled network-based quality control method for improving key features in product manufacturing process - صفحه:535-548

  tick  An application of Hebbian learning in the design process decision-making - صفحه:487-506

  tick  An intelligent neural-fuzzy model for an in-process surface roughness monitoring system in end milling operations - صفحه:689-700

  tick  Automated thermal fuse inspection using machine vision and artificial neural networks - صفحه:639-651

  tick  Branch-and-bound and PSO algorithms for no-wait job shop scheduling - صفحه:679-688

  tick  Decision-making in the manufacturing environment using a value-risk graph - صفحه:617-630

  tick  Improved prediction of stability lobes in milling process using time series analysis - صفحه:665-677

  tick  Machining activity extraction and energy attributes inheritance method to support intelligent energy estimation of machining process - صفحه:595-616

  tick  Multiobjective optimization of torch brazing process by a hybrid of fuzzy logic and multiobjective artificial bee colony algorithm - صفحه:631-638

  tick  Process analytics formalism for decision guidance in sustainable manufacturing - صفحه:561-580

  tick  Real-time simulation of neural network classifications from characteristics emitted by acoustic emission during horizontal single grit scratch tests - صفحه:507-523

  tick  Statistical modeling and optimization of resistance spot welding process parameters using neural networks and multi-objective genetic algorithm - صفحه:549-559

  tick  The preparation of organic light-emitting diode encapsulation barrier layer by low-temperature plasma-enhanced chemical vapor deposition: a study on the $$hbox {SiO}_mathrm{x}hbox {N}_mathrm{y}$$ SiO x N y film parameter optimization - صفحه:581-593
 

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