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long-term follow-up of transcatheter ventricular septal defect closure in children, and comparison of single-hole versus multi-holes ventricular septal defects
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نویسنده
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alizadeh behzad ,mortezaeian hojjat ,haas nikolaus ,meraji mahmood ,khalili yasaman ,vesal ahmad ,farshidgohar mina
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منبع
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innovative journal of pediatrics - 2022 - دوره : 32 - شماره : 6 - صفحه:1 -8
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چکیده
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Background: evaluation of complications after transcatheter ventricular septal defect (vsd) closure in long-term follow-up and large samples of children is limited. objectives: we compared the residual shunt after transcatheter closure in vsds with a single hole and multiple holes, a new task that has not been done so far. methods: this retrospective study included all patients who underwent transcatheter device closure for vsd in a tertiary cardiovascular center from 2009 to 2020. follow-up evaluation using transthoracic echocardiography (tte) and electrocardiogram (ecg) was performed at 1, 6, 12 months, and annually after the procedure. results: a total of 409 patients underwent transcatheter vsd closure. the mean age was 7 years (2 - 15 years), and the median follow-up duration was 48 months (1 - 10 years). the number of patients with a singular vsd was 259 (63.4%), and those with multiple exit holes were 150 (36.6%). the incidence of a residual shunt immediately after implantation was significantly higher in vsds with multiple holes than those with a single hole (p = 0.008). during the follow-up, the residual shunts decreased in the group of vsds with a single hole. forty-five patients (11%) and 16 patients (4%) had a new-onset of mild and moderate tricuspid regurgitation (tr), respectively, and it decreased dramatically over time. only 1 patient showed a new-onset mild aortic regurgitation (ar). the most crucial complication shown in 2 patients was a persistent complete heart block. conclusions: ventricular septal defects with multiple exit holes are a risk factor for a residual shunt. after transcatheter vsd closure, the residual shunt in patients with a multiple-hole vsd was significantly higher (p = 0.008). although tr may increase during the procedure, it decreases dramatically over time. interestingly, patients who had pre-procedure tricuspid or aortic regurgitation disappeared after 2 years of the procedure. the most important complication was a complete heart block in 2 patients.
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کلیدواژه
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ventricular septal defect ,transcatheter closure ,tricuspid regurgitation (tr) ,aortic regurgitation (ar) residual shunt ,mono-hole vsds ,multiple-hole vsds ,follow-up
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آدرس
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mashhad university of medical sciences, school of medicine, department of pediatric interventional cardiology, iran, iran university of medical sciences, medical and research center, iran, ludwig maximilians university, department of pediatric cardiology and intensive care, germany. munich university hospital, department of pediatric cardiology and intensive care, germany, iran university of medical sciences, medical and research center, iran, iran university of medical sciences, medical and research center, iran, iran university of medical sciences, medical and research center, iran, qazvin university of medical sciences, children growth research center, research institute for prevention of non communicable disease, iran
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پست الکترونیکی
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dr.farshidgohar@yahoo.com
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Authors
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