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upcoming methods and specifcations of continuousintraocular pressure monitoring systems for glaucoma
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نویسنده
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molaei amir ,karamzadeh vahid ,safi sare ,esfandiari hamed ,dargahi javad ,azam khosravi mohammad
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منبع
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journal of ophthalmic and vision research - 2018 - دوره : 13 - شماره : 1 - صفحه:66 -71
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چکیده
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Glaucoma is the leading cause of irreversible blindness and vision loss in the world. although intraocular pressure (iop) is no longer considered the only risk factor for glaucoma, it is still the most important one. in most cases, high iop is secondary to trabecular meshwork dysfunction. high iop leads to compaction of the lamina cribrosa and subsequent damage to retinal ganglion cell axons. damage to the optic nerve head is evident on funduscopy as posterior bowing of the lamina cribrosa and increased cupping. currently, the only documented method to slow or halt the progression of this disease is to decrease the iop; hence, accurate iop measurement is crucial not only for diagnosis, but also for the management. due to the dynamic nature and fluctuation of the iop, a single clinical measurement is not a reliable indicator of diurnal iop; it requires 24‑hour monitoring methods. technological advances in microelectromechanical systems and microfluidics provide a promising solution for the effective measurement of iop. this paper provides a broad overview of the upcoming technologies to be used for continuous iop monitoring.
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کلیدواژه
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continuous monitoring ,glaucoma ,implantable pressure sensor ,intraocular pressure ,microelectromechanical systems ,microfluidics
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آدرس
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concordia university, department of mechanical engineering, canada, concordia university, department of mechanical engineering, canada, shahid beheshti university of medical sciences, ophthalmic research center, , iran, shahid beheshti university of medical sciences, ophthalmic research center, iran. university of pittsburgh, school of medicine, department of ophthalmology, usa, concordia university, department of mechanical engineering, canada, amirkabir university of technology, department of electrical engineering, iran
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Authors
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