simulation of ion beam interaction of plasma focus device with the inner surface of faraday cup

One of the important topics in the use of faraday cup in plasma focus devices is the production of secondary electrons due to the collision of beam particles with the inner surface of the faraday cup and their trapping in the measurement of particle beam flow by the cup. therefore, in this study, the simulation of the geometrical effects such as the depth and internal structure of the cup on the production of secondary electrons and the output current of the faraday cup has been done. the used simulation tool is cst studio suite. based on the simulation results, reducing the aspect ratio leads to an increase in the particle trapping ability, and as a result, the flow measured by the faraday cup is closer to the real flow. furthermore, the faraday cup current for a cylindrical sample is greater than the actual current and in the ramp example, the faraday cup current is closer to the actual value.