structural and optical study of ni-cu thin films with the different copper percentage

In this paper, we report co-deposition ofrf-sputtering and rf-pecvd for growthof ni nps @ a-c: h with differentpercentages of cu. we studied opticalconstants of ni-cu thin films, withconstant ni content and differentpercentages of 5%, 40%, and 75 % fromcu atoms. with the increase of cupercentage, the rms roughness of filmswas decreased. all films exhibit areflectance and transmittance of about20% and 50%, respectively.