>
Fa   |   Ar   |   En
   selection and tuning propagation path loss model for hawassa city, ethiopia at 1800 mhz frequency  
   
نویسنده yenealem tamirat ,getachew robel
منبع journal of applied research in electrical engineering - 2023 - دوره : 2 - شماره : 2 - صفحه:127 -135
چکیده    Path loss models estimate the average path loss a signal experiences at a particular distance from a transmitter. however, each type of existing path loss propagation model is designed to predict path loss in a particular environment that may be inaccurate in other different; hence selecting the best path loss model and optimizing it will minimize that inaccuracy. this work presents a comparative analysis of five empirical path loss models, cost- 231, ecc-33, hata, sui, and ericsson model, with respect to the measured data from the 14 selected sites in hawassa city, ethiopia at 1800 mhz frequency bands. a drive test methodology was adopted for data collection and nemo handy and nemo outdoor were used as measuring tools for the test. error measuring tools such as root mean square error, mean absolute error, standard deviation, and mean absolute percentage error were used to select the terrain type of each site and the path loss model that best fits that site. the results show that not only hawassa city consists of urban and sub-urban terrains but also ecc-33 and hata are better estimators for hawassa urban and sub-urban areas with rmse of 4.18 and 7.86 respectively. the model tuning using the least square method reduced the rmse of ecc-33 and hata to 2.46 and 5.18 respectively. the reduction in rmse shows that the tuned versions are close to the environment. hence, using the tuned versions of the selected models will result in good cellular network design and enhance the service quality.
کلیدواژه path loss ,path loss model ,urban ,sub-urban ,model tuning ,least square method
آدرس hawassa university, ethiopia, ethio telecom, ethiopia
پست الکترونیکی robogetachew@gmail.com
 
     
   
Authors
  
 
 

Copyright 2023
Islamic World Science Citation Center
All Rights Reserved