considering testing environment uncertainty in an nhpp model with exponentiated weibull tef

This study presents an approach to software reliability estimation by incorporating an exponentiated weibull testing effort function into a logistic software reliability growth model (srgm) under the influence of uncertain factors. these uncertainty factors account for the variability and imprecision present in the software-testing environment, which often arise from assumptions and parameter estimations. the proposed model’s practical applicability is illustrated using a real-world software failure dataset. to evaluate its performance, comparisons are made with several well-established srgms using three standard evaluation criteria. the results indicate that the proposed model offers improved reliability estimation accuracy and outperforms selected existing models by obtaining the highest r2 value and the lowest mse and sse values.