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Defect Detection in Tire X-Ray Images Using Weighted Texture Dissimilarity
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نویسنده
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guo q. ,zhang c. ,liu h. ,zhang x.
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منبع
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journal of sensors - 2016 - دوره : 2016 - شماره : 0
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چکیده
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Automatic defect detection is an important and challenging problem in industrial quality inspection. this paper proposes an efficient defect detection method for tire quality assurance,which takes advantage of the feature similarity of tire images to capture the anomalies. the proposed detection algorithm mainly consists of three steps. firstly,the local kernel regression descriptor is exploited to derive a set of feature vectors of an inspected tire image. these feature vectors are used to evaluate the feature dissimilarity of pixels. next,the texture distortion degree of each pixel is estimated by weighted averaging of the dissimilarity between one pixel and its neighbors,which results in an anomaly map of the inspected image. finally,the defects are located by segmenting this anomaly map with a simple thresholding process. different from some existing detection algorithms that fail to work for tire tread images,the proposed detection algorithm works well not only for sidewall images but also for tread images. experimental results demonstrate that the proposed algorithm can accurately locate the defects of tire images and outperforms the traditional defect detection algorithms in terms of various quantitative metrics. © 2016 qiang guo et al.
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آدرس
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school of computer science and technology,shandong university of finance and economics,jinan,china,school of computer science and technology,shandong university,jinan,china,shandong provincial key laboratory of digital media technology,jinan, China, school of computer science and technology,shandong university,jinan,china,shandong provincial key laboratory of digital media technology,jinan, China, school of computer science and technology,shandong university of finance and economics,jinan,china,shandong provincial key laboratory of digital media technology,jinan, China, school of information and electrical engineering,ludong university,yantai, China
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Authors
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