|
|
|
|
Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
|
|
|
|
|
|
|
|
نویسنده
|
wang z. ,he b. ,ma w. ,yao z. ,huang s. ,liu m. ,sheng j.
|
|
منبع
|
journal of sensors - 2016 - دوره : 2016 - شماره : 0
|
|
چکیده
|
The evaluation of the degradation on a cots linear charge coupled device (ccd) induced by total ionizing dose (tid) radiation damage was presented. the radiation experiments were carried out at a 60co γ-ray source. the parameters of dalsa's linear ccd were measured at the ccd test systems as the emva1288 standard before and after the radiation. the dark current,dark signal nonuniformity (dsnu),photo response nonuniformity (prnu),saturation output,full-well capacity (fwc),quantum efficiency (qe),and responsivity versus the tid were analyzed. the behavior of the tested ccd had shown a remarkable degradation after radiation. the degradation mechanisms of the ccd induced by tid damage were also discussed. © 2016 zujun wang et al.
|
|
|
|
|
آدرس
|
state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China, state key laboratory of intense pulsed irradiation simulation and effect,northwest institute of nuclear technology,p.o. box 69-10,xi'an, China
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Authors
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|