A New Low Power High Reliability Flip-Flop Robust Against Process Variations

Low scaling technology makes a significant reduction in dimension and supply voltage, and leads to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in vlsi circuits. in this area, different design methods have been proposed for low power flip-flops and various research studies have been done to reach a suitable hardened flip-flops. in this paper, we combine these two generally separate addressed issues to reach a new low power high reliability flip-flop (lp-hrff). lp-hrff operates over 1ghz clock frequency and is structured based on an appropriate combination of dual interlocked storage cell, level converting techniques and clock signal controlled gates. the extensive simulations exhibit lp-hrff has 0% single event upset rate against single transient events occurred on inputs and internal nodes and show the improvement of power consumption up to 42.8% and power delay product up to 24.6% compared with its counterparts. furthermore, the simulation results approve the robustness and efficacy of the proposed flip-flop against process variations.