Reflection of Polarized Light at Quasi-Index-Matched Dielectric-Conductor Interfaces

Quasi-index-matched (qim) dielectric-conductor interfaces are characterized by a unit-magnitude complex relative dielectric function, ε = exp(- jθ ),0 ≤θ ≤ π , and exhibit minimum reflectance at normal incidence. their reflection properties are analyzed in detail as functions of the incident linear polarization (p or s), angle of incidence φ and θ. complex-plane trajectories of the fresnel reflection coefficients rp (φ), rs (φ) and their ratio ρ(φ) = rp / rs = tan ψ exp( jδ) as φ increases from 0 to 90° are presented at discrete values of θ. absolute values and phase angles of rp, rs and ρ are also plotted as functions of φ. finally, the pseudo-brewster angle of minimum |rp| , the second-brewster angle of minimum |ρ| , the principal angle at which δ= π / 2 and the special angle (φ = sin^-1 ⱱ0.5secθ) at which δ p = arg(rp ) = ±π of qim interfaces are determined as functions of θ.