Experimental and theoretical investigation into X-ray shielding properties of thin lead films

Among all of the radiations, x-ray has been always the center ofattention due to the increasing availability of the x-ray tubes in industry,research institutes and medical centers. in this study, x-ray shieldingproperties of bulk and nanostructured thin lead films were investigated bymeans of monte-carlo computational and experimental methods,respectively. materials and methods: the lead samples were fabricated bythe physical vapor deposition technique (pvd) with different thickness of 10,100 and 1000 nm. to investigate the radiation shielding properties of thenanostructured thin films, all of the prepared samples were subjected to thex-ray ranging from 8 to 14 kev. in order to consider the shielding propertiesof the bulk-structured thin films, the monte-carlo mcnpx code wasemployed. results: the results indicated that, for low x-ray energies, thenanostructured thin lead films attenuate more than bulk-structured samples;however, the difference disappears as film thickness increases to 1000 nm orx-ray energy reaches 14 kev. conclusion: results imply that thenanostructured thin lead films attenuate more photons than the bulkstructuredthin lead films with the same thicknesses