an overview of scanning near-field optical microscopy in characterization of nano-materials
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نویسنده
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sobat z. ,sadegh hassani s.
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منبع
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international journal of nano dimension - 2014 - دوره : 5 - شماره : 3 - صفحه:203 -212
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چکیده
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Scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of diverse snom methods mostly based on aperture and aperture-less is presented.
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کلیدواژه
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scanning near-field optical microscopy; scanning probe microscope; nano structures; optical microscopy; aperture less snom; photon scanning tunneling microscopy; optical fiber
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آدرس
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research institute of petroleum industry, catalysis and nanotechnology research division, ایران, research institute of petroleum industry, catalysis and nanotechnology research division, ایران
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پست الکترونیکی
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sadeghs@ripi.ir
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