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determination of porous silicon thermal conductivity using the “mirage effect” method
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نویسنده
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alfeel f. ,awad f. ,qamar f.
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منبع
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international journal of nano dimension - 2014 - دوره : 5 - شماره : 3 - صفحه:267 -272
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چکیده
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Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection ptd in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. ps samples were prepared by electrochemical etching. thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.
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کلیدواژه
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mirage effect ,non destructive method ,photothermal deflection ptd ,thermal conductivity ,porous silicon ,electrochemical etching ,nano crystalline ,film
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آدرس
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damascus university, science faculty, department of physics, syria, damascus university, science faculty, department of physics, syria, damascus university, science faculty, department of physics, syria
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Authors
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