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Surface and Near Surface Analysis by Ion Beam Techniques
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نویسنده
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Baghizadeh Ali ,Agha Aligol Davoud ,Talebi-Taher Alireza ,Lamehi-Rachti Mohammad ,Moradi Mahmood
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منبع
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journal of theoretical and applied physics - 2007 - دوره : 1 - شماره : 1 - صفحه:37 -41
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چکیده
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The specific aspects of ion beam analysis (iba) for near surface and thin film characterization are discussed.the application of lea techniques in material science , surface physics, thin film deposition and crystal growthhas been investigated. in this paper, we report some new obtained resulls in van de graaff laboratory on thedifferent samples after installation of channeling and micro-beam systems . the aim of this paper is descriptionof the iba techniques capabilities in material analysis.
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آدرس
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Nuclear Science and Technology ResearchInstitute (NSTRl), Nuclear Scinece Reseach School, Van de Graaff Laboratory, ایران, Nuclear Science and Technology ResearchInstitute (NSTRl), Nuclear Scinece Reseach School, Van de GraaffLaboratory, ایران, Nuclear Science and Technology ResearchInstitute (NSTRl), Nuclear Scinece Reseach School, Van de GraaffLaboratory, ایران, Nuclear Science and Technology Research Institute (NSTRl), Nuclear Scinece Reseach School, Van de Graaff Laboratory, ایران
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Authors
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