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Shielding Effectiveness of a Lossy Metallic Enclosure
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نویسنده
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Pedram1 M ,Pedram M ,Dehkhoda P ,Sadeghi H ,Moini R
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منبع
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aut journal of electrical engineering - 2013 - دوره : 45 - شماره : 1 - صفحه:17 -26
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چکیده
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In this paper, shielding effectiveness (se) of a perforated enclosure with imperfectly conducting walls is evaluated. to this end, first, an accurate numerical technique based on method of moments (mom) is presented. in this method, lossy metallic walls of the enclosure are replaced by equivalent electric surface current sources. then, the impedance boundary condition on the imperfectly conducting surfaces is applied and an electric field integral equation is extracted. at the end, the integral equation is solved numerically by galerkin method. in addition to the mentioned numerical method, an extremely fast analytical technique based on transmission line model(tlm) is proposed which is able to predict the se with high level of accuracy over a large frequency bandwidth just in a few seconds. for validation of both methods, other commercial softwares (feko and cst) are employed and several enclosures with different conductivities are studied. lossy mom method shows accurate results for conductivities down to 10s/m, while efficient tlm method proves its accuracy for conductivities down to 250s/m.
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کلیدواژه
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Finite Conductivity ,Lossy Metallic Box ,Shielding Effectiveness ,Shielding Enclosure ,Transmission Line Method
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آدرس
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amirkabir university of technology, MSc Student, Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran, ایران, amirkabir university of technology, MSc Student, Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran, ایران, amirkabir university of technology, Assistant Professor, Institute of Communications Technology and Applied Electromagnetics, Amirkabir University of Technology, Tehran, Iran, ایران, amirkabir university of technology, Professor, Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran, ایران, amirkabir university of technology, Professor, Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran, ایران
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Authors
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